Analytical Characterization

tei Solutions offers several analytical characterization services in microscopy, spectroscopy and failure analysis.

Analytical Testing Electrical Testing Reliability Testing Material & Tool Testing
  • SEM
  • TEM
  • STEM
  • EDS
  • EELS
  • SIMS
  • Focused Ion Beam
  • Auger
  • XPS
  • ICP
  • Particle Scan
  • Film Thickness
  • IR-OBIRCH
  • EBAC
  • Nano Probe
  • PEM
  • TDDB
  • NBTI
  • Electro Migration
  • ESD
  • HCI
  • High Temp Operation Test
  • Low Temp Operation Test
  • Temperature Cycle Test
  • PCT
  • HAST
  • Others
  • ICP-MS
  • ICP
  • ZAA
  • TXRF
  • ICG
  • GC-MS
  • P&T-GC
  • MFS
  • FTIR
  • API-MS